Nanoscience: AFM and SPM

Bruker DiCaliber Scanning Probe Microscope

Scanning Probe Microscopy (SPM) is a class of microscopes that use a physical probe to map the topography of a surface at nanoscale dimensions. In atomic force microsocpy (AFM), a 1-10 µm cantilever with an ultrasharp tip (< 10 nm radius) applies a small force to the surface. A laser is indent on the backside of the reflective cantilever and directed towards a 4-quadrant photodiode used a a positioning sensor for the Z-piezo scanner. Vertical changes in the laser deflection spot are translated into vertical movements by the Z-piezo scanner, which allows the system to maintain a constant force on the surface and produce a 3-D topography image of the sample.

Bruker DiCaliber Scanning Probe Microscope

Features

  • Contact Mode Imaging
  • Lateral Force Microscopy (LFM)
  • Tapping Mode Imaging
  • Phase Imaging
  • Magnetic Force Microscopy (MFM)
  • Nanolithography
  • Scanning Tunneling Microscopy

Applications

  • Materials & Surface Science
  • Polymers & Biopolymers
  • Thin Films and Surface Coatings
  • Nanomaterials
  • Nanolithography and Surface Modification

Examples

Sample Description
Topography of a sputter coated alumina film Topography of a sputter coated alumina film
Phase Image of a A-B-A triblock copolymer film on silicon Phase Image of a A-B-A triblock copolymer film on silicon
A dropcast film of 300-nm polystyrene spheres on glass A dropcast film of 300-nm polystyrene spheres on glass