Nanoscience: Scanning Electron Microscopy
FEI Inspect S50 Scanning Electron Microscope
Scanning Electron Microscopy (SEM) exploits the smaill wavelength of an electron to produce high resolution images with magnifcations exceeding 100 000X. This image can be obtained by measuring either the backscattered (i.e. reflected) incident electrons or secondary electrons ejected from the sample surface.
Features
- Magnification from 20 to 100000X
- Resolution of 10 nm
- Secondary Electron/Backscatter Detection
- High Vacuum and Low Vacuum Imaging Available
- Multiple Sample Stage (up to 7 standard SEM stubs)
- Sample Stage Voltage Bias (0 to 5000 V)
- Elemental analysis (Equipped with Oxford X-Max20 SSD)
Applications
- Metals,Metal Oxides & Alloys - oxidation/corrosion, failure, welds, etc.
- Ceramics, Composites, Plastics, etc.
- Catalysts
- Thin Films and Coatings
- Geological Minerals (structure and identification)
- Particles, Fibers and Porous materials
- Nanomaterials and Nanostructures
- Soft Materials - polymers/biopolymers, filters, tissues, plant materials, bacteria, pharmaceuticals
Examples
Sample | Description |
---|---|
Gold nanowire (200 nm dia.) array obtained at 45o angle. A single Au wire is shown in the inset image | |
Pt:Pb (95:5) nanodendritic crystal grown on a silicon substrate | |
An array of 350-nm polystyrene spheres drop-cast onto glass | |
The structure of a moth wing magnified by 10000X | |
The structure of a fruit fly wing magnified by 3000X | |
The structure of a green plant bug wing magnified by 3000X | |
The structure of a moth eye magnified by 1600X | |
The structure of a fruit fly eye magnified by 1600X | |
The structure of a green plant bug eye magnified by 1600X |